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 ELECTRICAL CHARACTERIZATION OF THE FORWARD CURRENTVOLTAGE OF AL IMPLANTED 4H-SIC PIN DIODES.
<strong>Courrier du Savoir</strong>, [S.l.], v. 19, mars 2015.
ISSN 1112-3338.
Disponible à l'adresse&nbsp;: &gt;<a href="https://revues.univ-biskra.dz/index.php/cds/article/view/1207" target="_new">https://revues.univ-biskra.dz/index.php/cds/article/view/1207</a>&gt;. Date de consultation&nbsp;: 19 avr. 2024